Pico–femto–attosecond metrology for advanced and XUV photon sources - UFR de Chimie de Sorbonne-Université Access content directly
Conference Papers Year : 2020

Pico–femto–attosecond metrology for advanced and XUV photon sources

Abstract

We present a new Velocity Map Imaging (VMI) spectrometer based on the thick-lens configuration to be implemented at different XUV source beamlines to realize the measurements of the pulse temporal structure using the technique of laser-dressed photoionization.
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Dates and versions

cea-04479351 , version 1 (27-02-2024)

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Cite

T. Sinyakova, C. Bomme, D. Cubaynes, C. Bourassin-Bouchet, A. Gharbi, et al.. Pico–femto–attosecond metrology for advanced and XUV photon sources. ICXRL 2018 - International Conference on X-ray Lasers, Oct 2018, Prague, Czech Republic. pp.163 - 168, ⟨10.1007/978-3-030-35453-4_24⟩. ⟨cea-04479351⟩
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